Changes between Version 8 and Version 9 of projectstructure


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Timestamp:
Jun 16, 2008, 4:19:02 PM (16 years ago)
Author:
fpecheux
Comment:

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  • projectstructure

    v8 v9  
    3030|| '''Task  1.a''' :  Performance measurement Task manager : '''LETI''' Partners : LETI, LIRMM In this task, the performance of the tile is monitored. The difficulty is to reach the minimum perturbation requirement. We propose to develop two mechanisms. The first one is SW oriented and consists on measuring periodically, or on-line the processors as well as their communication workloads. The Network Interface of the NoC will help to have a generic way to perform in/out throughput on-line monitoring. The second mechanism is HW oriented and consists in probing some chosen critical paths. The advantage of this kind of monitoring is the non-intrusive property, but the difficulty is to have access to the data paths or the control part. Both HW and SW solutions will be studied and compared in this task.
    3131|| T0 → T0+18||
    32 || Status : not achieved yet||
     32|| Status : '''not achieved yet'''||
    3333[[BR]]
    3434|| '''Task  1.b''' :  PVT management Task manager : '''LETI'''  Partners :  LETI, LIP6 The objective of this task is the monitoring of physical information, such as temperature, voltage and power consumption. This can be obtained by the way of direct measurement, with on-site temperature sensors for example, or with non direct measurement, thanks to SW load evaluation and equivalent tables. Due to parameters dispersions throughout the chip in nanotechnologies, HW on-site sensors will be probably necessary. Nevertheless, non direct measurement will add another dimension and help the diagnosis phase. These two techniques will be studied and evaluated in this task. Some of the chosen techniques will also be implemented.
    3535|| T0 → T0+24||
    36 || Status : not achieved yet||
     36|| Status : '''not achieved yet'''||
    3737[[BR]]
    3838|| '''Task  1.c''' :  HW fault detection Task manager : '''LETI'''  Partners : All Nanotechnologies are leading to more and more difficulties to ensure a correct behavior of the tiles and interconnects between tiles during the chip lifetime. The fault detection is then becoming a mandatory feature of future architectures. The objective of this WP is to evaluate some of the HW and SW possible techniques, like on-line or periodic testing, BIST, software CRC or software security survey tasks. As the field of research is very vast and it is not the aim of the project to have a full protection against faults, just a few techniques will be implemented. The objective is to add this dimension to the event table, because of its importance.
    3939|| T0 → T0+24||
    40 || Status : not achieved yet||
     40|| Status : '''not achieved yet'''||